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2024 12 08 test dependencies#209

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Merged

cmeyer merged 11 commits intomasternion-software/nionswift-instrumentation-kit:masterfrom 2024-12-08-test-dependenciesnion-software/nionswift-instrumentation-kit:2024-12-08-test-dependenciesCopy head branch name to clipboardDec 30, 2024

+1,755-310

Commits

Commits on Dec 12, 2024

• WIP: Move usim base classes in device_kit; use project versions for tests.

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  c96c2b9

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• Separate scan data generator; other minor fixes.

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Commits on Dec 29, 2024

• Restructure tests to use a device set object for config.

  cmeyer

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  e4ef0ef

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• Move acquisition test context config to separate file.

  cmeyer

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  3a2b0df

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• Separate axis manager use into a config parameter.

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• Separate value manager use into a parameter too.

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• Clean up typing and setup.

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• Use overridable method for test context to allow subclassing.

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• Refactor scan simulator within scan device to give more options for subclasses.

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• Add missing package files for device_kit.

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• Update build action to use reusable workflow.

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