2024 12 08 test dependencies

[cmeyer]

• WIP: Move usim base classes in device_kit; use project versions for tests.
• Separate scan data generator; other minor fixes.
• Restructure tests to use a device set object for config.
• Move acquisition test context config to separate file.
• Separate axis manager use into a config parameter.
• Separate value manager use into a parameter too.
• Clean up typing and setup.
• Use overridable method for test context to allow subclassing.
• Refactor scan simulator within scan device to give more options for subclasses.
• Add missing package files for device_kit.
• Update build action to use reusable workflow.