c# project providing a wafer map control
This project aims to provide a way to visualize wafer map data in windows applications A wafer map is something specific to semiconductor industry and usually the data is coming from Wafer Probe using ATE
A more detailed documentation is coming soon (as soon as I've got time to do it)
Basically the useage should be quite self explaining In the meantime I'll just provide a snipped out of my test class:
for (int waferNum = 0; waferNum < nrWafers; waferNum++)
{
// Create sample dataset
int[,] data = new int[300, 300];
Random binGenerator = new Random(waferNum);
for (int x = 0; x < 300; x++)
{
for (int y = 0; y < 300; y++)
{
data[x, y] = binGenerator.Next(8);
}
}
WafermapImpl wmap = new WafermapImpl();
wmap.Dataset = data;
wmap.Notchlocation = 90;
wmap.MinimumSize = new Size(250,250);
wmap.Interactive = true;
//this.Controls.Add(wmap);
flowLayoutPanel1.Controls.Add(wmap);
}
Here's the implementation class: class WafermapImpl : Wafermap {
public override void dieEntered(int x, int y, int bincode)
{
// Do nothing
}
public override void dieClicked(int x, int y, int bincode, System.Windows.Forms.MouseButtons btn)
{
// Cast
if (btn == MouseButtons.Left)
{
// Update dataset
Dataset[x, y] = 2;
// Show the changes
updateDie(x, y, 2);
}
else
{
// Rotation test
int rot=Rotation + 90;
if (rot > 270)
rot = rot - 360;
Rotation = rot;
Invalidate();
}
}
}
The 2 overwrittern methods get called by the Wafermap class when a die is clicked or when the mouse pointer enters a die in the visualization